Vector Network Analysis

Transcription

Portfolio BrochureVector NetworkAnalysisProduct Portfolio

Vector Network AnalysisVNA Innovation TimelineIn 1965, Anritsu filed the patent that defined thefirst modern Vector Network Analyzer (VNA).Wiltron 310 Impedance Meter12 GHz coax18 GHz WGWe are proud to continue that tradition of innovationto the present day—with the world’s first portfolio ofVNAs that bring Nonlinear Transmission Line (NLTL)technology to every measurement scenario fromon-wafer device characterization to R&D testing tomanufacturing and field operations.31012 GHz coax18 GHz WG19651987360A VNA40 MHz to 40 GHz1994Lightning 37000E40 MHz to 65 GHz22001Broadband andmmWave VNA ME780840 MHz to 110 GHz

VNA Product PortfolioSite Master S820E1 MHz to 40 GHzVectorStarTM MS4640A70 kHz to 20, 40, 50and 70 GHz2006VNA Master MS202/3xA2 MHz to 6 GHz20092011VectorStarME7838D70 kHz to 220 GHzShockLine 2- and4-Port VNAs50 kHz to 43.5 GHz2014VectorStarME7838G70 kHz to 220 GHzVectorStarME7838A70 kHz to 110 GHz3ShockLine ME7868A2-Port VNA System1 MHz to 43.5 GHz2020ShockLine MS46131A1-Port VNA1 MHz to 43.5 GHz

Vector Network AnalysisPassive ComponentsPassive ComponentsPassive RF and microwave components such as antennas, filters, cables, andconnectors are used in all types of wireless systems. These types of componentstypically require basic S-parameter and time domain testing to fully characterizetheir performance. Vector Network Analyzers (VNAs) are the optimal instrumentto make those measurements.For passive components like connectors, cables, and adapters all that is needed to test them issimple S-parameter measurements.Active ComponentsAnritsu handheld Vector Network Analyzers are designed and optimized for field use and are ableto make all of the passive measurements required in the field with high accuracy and repeatability.Distance Domain is standard on every Anritsu handheld VNA or Cable & Antenna Analyzer instrument,allowing users to quickly locate and identify faults within a coaxial or waveguide transmission system.High dynamic range enables easy antenna isolation measurements which is typically required at mostsites. The highest RF immunity ( 17 dBm) provides high accuracy and quality measurements, unaffectedby strong RF/microwave signals which may be present nearby.Broadband andMillimeter-waveOn-waferSignal IntegrityThe ShockLine family of VNAs from Anritsu offer a broad range of configurations and performancelevels to test a wide variety of passive components. Consisting of 1-, 2-, and 4-port models coveringfrequencies up to 92 GHz, ShockLine VNAs deliver the flexibility to economically test passive devicesfrom simple cables and connectors all the way up to high performance 5G filters and E-band antennas.All of the ShockLine VNAs share common test software which enables an easy transition betweenverifying a device undertest with a performanceVNA model on the bench,and testing it with aneconomy model inmanufacturing. Designedwithout embedded touchscreen or keypad, ShockLineVNAs are very small androbust, minimizing spacerequirements andmaximizing uptime.Band-Pass Filter Measurement with a ShockLine VNA4

Our SolutionsDesigned for Field UseNeed to make accurate, reliable measurementsin typical outdoor environment with largetemperature variations?Anritsu handheld analyzers utilize Active Thermal Managementwhich enables them to quickly stabilize to typical outdoorenvironments. This results in reliable measurement accuracyand repeatability in any environment.Need fully reversing 2-port VNA measurementcapability in the field.Anritsu has several models of 2-port fully reversing VNAanalyzers with coverage up to 43.5 GHz.Remote sites are often difficult to access,which makes traditional equipmenttransportation impossible.Anritsu handheld analyzers are compact and typically weighless than 7 lbs. Their compact size and weight allows them to beeasily carried to remote locations.Access to AC power not readily available atsome sites.Anritsu handheld analyzers operate from an easily replaceableinternal battery when AC power is not available. Spare batteriescan be used to extend operation time if needed.Reduce the Cost of TestNeed to reduce operating expenses (OPEX)?Multiple site visits are very costly andinefficient.Since 1996 Anritsu has been the leader in handheld test andmeasurement equipment. Anritsu is the de facto standardaround the world.Need to minimize the cost of test to staycompetitive in your industry.Anritsu offers a wide selection of VNAs to fit a broad range ofpassive device applications and budget.Cannot afford costly downtime in yourproduction environment.ShockLine VNAs are compact and more robust withoutfragile keypad or display.Need a low cost test solution withoutcompromising performance.You get high performance at a low cost.Active ComponentsPassive Testing ChallengesPassive ComponentsVNA Product PortfolioSpace is at a premium in the productionenvironment.Choice of multiple compact packages saves bench spaceand efficiently uses rack space.Need seamless correlation of results fromthe design environment to the productionenvironment.Easily migrate from performance to economy modelswhile moving from design to production.Need simple setup and operation.Anritsu’s easyTest Tools software allows users to create workinstruction files on a PC, deliver these files by e-mail, andthen display work instructions on supported instrumentsand modes.Broadband andMillimeter-waveOn-waferEase of UseNeed to evaluate connector design withhighest available resolution.Unique low-frequency coverage from 70 kHz with up to100,000 measurement points to achieve the best timedomain measurement accuracy.Accurately measure medium and highloss devices. Catch all potential filterfeed-throughs in out-of-band regions.Superior dynamic range, up to 142 dB at 2.5 GHz and125 dB at 67 GHz.Minimize the need for recalibration fordifferent production line components.Highest data resolution utilizing 100,000 point for maximumflexibility. Move to different frequency spans and still zoomin on narrow band responses without recalibration.Improve productivity by reducing measurement guard bands utilizing optimummeasurement uncertainty.Best test port characteristic performance with up to 50 dBin directivity, source match and load match performancecombined with industry-leading dynamic range providesexcellent measurement accuracy.Key to Symbols:VectorStarShockLine5Master ProductsSignal IntegrityHigh Accuracy

Vector Network AnalysisPassive ComponentsActive ComponentsActive RF and microwave components such as amplifiers, mixers, and convertersare used in many types of wireless systems including cellular, automotive, IoT, and 5Gapplications. VNAs with source level control and receiver offset functionality canmeasure many of the typical active device test parameters like gain, distortion, andnoise figure.Active ComponentsVectorStar offers a wide range of standard performance and instrument options for optimizing measurements of active devices. The high available power, up to 14 dBm at 20 GHz and 6 dBm at 67 GHz, providesenough power to measure compression properties of high power amplifiers without the need to searchfor external components. The high receiver compression point, 15 dBm at 70 GHz, often eliminatesthe need for additional external or internal attenuators.The ShockLine MS4652xB Performance VNAs offer economical capabilities to test simple linear activedevices not requiring the performance of VectorStar. ShockLine’s optional direct access loops, biasTees (8.5 GHz models), ALC power control, and multiple embedded sources enable tests like gain anddistortion measurements on simple active devices.Active Measurements SuiteBroadband andMillimeter-waveOn-waferWhen measuring active devices, the Active Measurement Suite options provide a wide range of analysistools for proper characterization of devices, components, and systems. First, there is the choice of twoor four internal step attenuators for forward and reverse sweeps. This provides the opportunity toreduce instrument costs when maximum power range control in the reverse direction is not needed.Next, the measurement suite includes internal bias tees allowing component biasing directly thoughthe VNA test port rather than needing external bias tee components. The measurement suite includesgain compression software that greatly simplifies the compression analysis process. With a powersweep configured, the software provides automatic normalization for easy identification of the startin gain roll off. The software also provides the ability to set flags indicating the user defined gaincompression points with data provided in graph or tabular format. In addition, the swept powercan be programmed for multiple frequencies for full analysis using the multiple frequency gaincompression function.Noise Figure MeasurementsSignal IntegrityThe Noise Figure Measurement Optionadds the capability to measure noise figureof active devices from 70 kHz to 145 GHz.The noise figure measurement is basedon a cold source technique for improvedaccuracy. Various levels of match andfixture correction are available foradditional enhancement. VectorStaris the only VNA platform optimized formeasuring noise figure up to 110 and145 GHz utlizing a unique receiver fornoise figure measurements.Millimeter-Wave (mmWave) Noise Figure Measurementswith a VectorStar VNA6

The Anritsu VectorStar MS4640B with PulseView option offers the most advanced architectureavailable in a VNA for pulse measurements. It offers industry-leading performance that eliminates thetradeoffs and limitations of prior test methods. Higher resolution, greater timing accuracy, and longerrecord lengths coupled with a real-time display give users the performance and confidence needed tomeet the most demanding radar pulse measurement requirements. Industry-leading 2.5 nsmeasurement resolution allows users to get a true view of their device performance and see behaviorthey may have been missing. Unlike traditional methods, the PulseView option does not requiresacrificing dynamic range and accuracy when analyzing devices with narrow duty cycles; users get thesame 100 dB dynamic range in all settings.Active Module/Sub-systemTesting ChallengesOur SolutionsHigh PerformanceWide selection of VNAs to fit a broad range of active deviceapplications and budget.Programmable source levels for active gain testing.Need a high performance analyzer for fast,efficient and accurate device and componentmeasurements in an R&D lab environment.Enables harmonic distortion testing.Active ComponentsPulse MeasurementsPassive ComponentsVNA Product PortfolioLow noise floor enable noise figure and distortionmeasurements.Design and develop high performanceamplifiers quickly and efficiently.Generate accurate device models using widebandwidth characterization.VectorStar provides a wide range of active device characterization including the highest performing pulse analysis, highestfrequency noise figure measurements, and accurate IMDmeasurements utilizing NLTL samplers.IMDView provides the ability to automatically switch betweenS-parameter measurements and intermodulation characterizationusing the optional internal second source and combiner.Only VNA with single sweep coverage starting as low as70 kHz and sweeping up to 110, 125, 145, and 220 GHz througha single coaxial connector. The wide, stable electronic powercontrol to as low as -55 dBm ensures that the device isaccurately modeled well within the linear operating region.Broadband andMillimeter-waveOn-waferEasily create active device tests using multiple programmingmethods: SCPI, IVI-C, scripting, easyTest, and 3rd partyenvironments such as LabVIEW.Maximize current equipment budgets whileprotecting the investment for future needs.Key to Symbols:VectorStarThe VectorStar platform supports a wide variety of upgradesincluding higher frequencies, higher port count, and increasedcapabilities. The only VNA platform that provides an upgradepath from a 2-port VNA to a 4-port system with upperfrequencies to 70 GHz in baseband and up to 110, 125,145, or220 GHz in broadband configuration. Protect investments bypurchasing what is needed today and upgrading to additionalcapabilities when budget and need allows.ShockLine7Master ProductsSignal IntegrityReduce the Cost of Test

Vector Network AnalysisPassive ComponentsBroadband and Millimeter-Wave (mmWave) On-WaferSemiconductor manufacturing test engineers face increased challenges todayrelated to broadband mmWave on-wafer testing. Developing accurate models oftenrequires measuring frequencies that range from near DC up to 100 GHz. Achievingaccurate, stable measurements over extended time periods is a challenge forfoundries and for fabless semiconductor companies that require extensive testingof on-wafer devices.Active ComponentsObtain the most thorough and accurate broadband device characterization while eliminating timeconsuming, error prone concatenation process across the RF, microwave, and mmWave frequencybands. This stable broadband performance means users can make high accuracy measurements allday, with the confidence that calibrations remains rock solid! Spend less time calibrating and moretime measuring.Broadband and Millimeter-Wave(mmWave) On-wafer Testing ChallengesOur SolutionsBroadband andMillimeter-waveOn-waferImprove on-wafer measurement performanceand add additional mmWave bands withouthaving to replace existing probe stations withlarge, expensive alternatives.Anritsu’s modern architecture provides a solution that is afraction of the size and weight of other solutions. The mmWavemodules fits on smaller probe stations and may be directlymounted to the probe. The broadband system incorporatingthe unique NLTL modules offer frequency coverage startingat 70 kHz and operating up to 110, 125, 145, and 220 GHz.Need to eliminate high frequency cable lossesand cable instabilities.ShockLine’s mmWave measurement capability is accomplishedusing modules tethered to the instrument through 1 m or 5 mcables, which enables the VNA to provide more power withhigher dynamic range at the DUT.Key to Symbols:VectorStarShockLineMaster ProductsSignal IntegrityMS46522B with E-Band Frequency Options55-92 GHz mmWave Options (1 m, 5 m) are theBest Value and Most Convenient Solutions on theMarket for Production Testing and Over-The-AirCharacterization of E-band ComponentsCompact and Lightweight mmWave ModulesOur Solution is Less than 8% the Weight and 2% theVolume of other Solutions, Enabling Low CostInstallation on Smaller Probe Stations8

Signal Integrity (SI) Testing ChallengesOur SolutionsPerform accurate SI characterization of highspeed data channels using quality lowfrequency measurements with highperformance upper frequency coverage.VectorStar has a low frequency receiver which covers 70 kHzto 2.5 GHz combined with a high frequency receiver operatingto 20, 40, 50, and 70 GHz in the baseband unit. By using thebest architecture for each band, high performance is achievedat all frequencies including best dynamic range 500 MHzand below.Need to ensure that high speed devicescomply to USB 3.1 and Thunderbolt3 test specs.ShockLine provides verification of latest high speed devices.Interactive eye-diagram characterization fordesign and debug.VectorStar with option 47 (Eye Diagram) offers live trace-basedeye-diagram capabilities for SI testing.Testing and verifying skew, crosstalk, andother SI specifications.ShockLine with option 22 (Advanced Time Domain) incorporatesthird party SI software into the ShockLine software, enablingNEXT, FEXT, and other SI tests.Key to Symbols:VectorStar VNAEye DiagramMeasurementHas Live Updatewith EveryFrequency SweepVectorStarShockLineShockline VNASI Measurements UsingAdvanced Time Domain9Master ProductsActive ComponentsFor lower frequency SI verification and testing, ShockLine MS4652xB series offers 2- and 4-port broadband models to 43.5 GHz. VectorStar and ShockLine include a suite of built-in tools for de-embeddingsingle ended or differential test fixtures without the need for external software programs for accuratesignal integrity measurements of backplanes, SERDES, and other devices of interest.Broadband andMillimeter-waveOn-waferToday’s signal integrity (SI) engineers are challenged to meet high data rates, minimizecosts, and close the loop of simulation and measurement. For example, VectorStarMS4640B’s industry-leading low-frequency measurement capability, as low as 70 kHz,coupled with upper range as high as 70 or 220 GHz, ensure that simulation-busting DCextrapolation and causality issues are minimized and your simulations match reality.Signal IntegritySignal IntegrityPassive ComponentsVNA Product Portfolio

Vector Network AnalysisPassive ComponentsAnritsu Vector Network AnalyzersBenchVectorStarMS464xB70 kHz to 20/40/50/70 GHzActive ComponentsManufacturingShockLine1-Port USB VNAMS46121B150 kHz to 6 GHzBroadband andMillimeter-waveOn-waferShockLine1-Port Modular VNAMS46131A1 MHz to 8/20/43.5 GHzFieldVNA MasterMS202xC5 kHz to 20 GHzSignal Integrity10

Passive ComponentsVNA Product PortfolioVectorStarBroadband VNAME7838A/E/D/G70 kHz to 110 /125/145/220 GHzwith banded mmWave modulesup to 1.1 THzShockLineCompact USB VNAMS46122B1 MHz to 8/20/43.5 GHzShockLinePerformance VNAsMS46522B50 kHz to 8.5/20/43.5 GHz55 GHz to 92 GHzShockLinePerformance VNAsMS46524B50 kHz to 8.5/20/43.5 GHzShockLineModular 2-Port VNA SystemME7868A1 MHz to 8/20/43.5 GHzMicrowave Site MasterHandheld Cable &Antenna AnalyzerS82xE1 MHz to 40 GHz11Signal IntegrityShockLineEconomy VNAMS46322B1 MHz to 8/20/43.5 GHzBroadband andMillimeter-waveOn-waferActive ComponentsVectorStar 4-PortBroadband VNAME7838A470 kHz to 110 /125 GHz

Specifications are subject to change without notice. United StatesAnritsu Americas Sales Company SingaporeAnritsu Pte. Ltd. SwedenAnritsu AB11 Chang Charn Road, #04-01, Shriro House, Singapore 159640Phone: 65-6282-2400Fax: 65-6282-2533450 Century Parkway, Suite 190, Allen, TX 75013 U.S.A.Phone: 1-800-Anritsu (1-800-267-4878)Kistagången 20 B, 2 tr, 164 40 Kista, SwedenPhone: 46-8-534-707-00700 Silver Seven Road, Suite 120, Kanata,Ontario K2V 1C3, CanadaPhone: 1-613-591-2003Fax: 1-613-591-1006Technopolis Aviapolis, Teknobulevardi 3-5 (D208.5.),FI-01530 Vantaa, FinlandPhone: 358-20-741-8100 CanadaAnritsu Electronics Ltd. BrazilAnritsu Eletronica Ltda.Praça Amadeu Amaral, 27 - 1 Andar01327-010 - Bela Vista - Sao Paulo - SP, BrazilPhone: 55-11-3283-2511Fax: 55-11-3288-6940 MexicoAnritsu Company, S.A. de C.V.Blvd Miguel de Cervantes Saavedra #169 Piso 1, Col. GranadaMexico, Ciudad de Mexico, 11520, MEXICOPhone: 52-55-4169-7104 United KingdomAnritsu EMEA Ltd.200 Capability Green, Luton, Bedfordshire, LU1 3LU, U.K.Phone: 44-1582-433200Fax: 44-1582-731303 FranceAnritsu S.A.12 avenue du Québec, Immeuble Goyave,91140 VILLEBON SUR YVETTE, FrancePhone: 33-1-60-92-15-50 GermanyAnritsu GmbHNemetschek Haus, Konrad-Zuse-Platz 1,81829 München, GermanyPhone: 49-89-442308-0Fax: 49-89-442308-55 ItalyAnritsu S.r.l.Spaces Eur Arte, Viale dell’Arte 25, 00144 Roma, ItalyPhone: 39-6-509-9711 FinlandAnritsu AB DenmarkAnritsu A/Sc/o Regus Winghouse, Ørestads Boulevard 73, 4th floor,2300 Copenhagen S, DenmarkPhone: 45-7211-2200 RussiaAnritsu EMEA Ltd.Representation Office in RussiaTverskaya str. 16/2, bld. 1, 7th floor., Moscow, 125009, RussiaPhone: 7-495-363-1694Fax: 7-495-935-8962 SpainAnritsu EMEA Ltd.Representation Office in Spain VietnamAnritsu Company Limited16th Floor, Peakview Tower, 36 Hoang Cau Street, O Cho Dua Ward,Dong Da District, Hanoi, VietnamPhone: 84-24-3201-2730 P.R. China (Shanghai)Anritsu (China) Co., Ltd.Room 2701-2705, Tower A, New Caohejing InternationalBusiness Center No. 391 Gui Ping Road Shanghai, 200233, P.R. ChinaPhone: 86-21-6237-0898Fax: 86-21-6237-0899 P.R. China (Hong Kong)Anritsu Company Ltd.Unit 1006-7, 10/F., Greenfield Tower, Concordia Plaza,No. 1 Science Museum Road, Tsim Sha Tsui East,Kowloon, Hong Kong, P.R. ChinaPhone: 852-2301-4980Fax: 852-2301-3545 JapanAnritsu CorporationPaseo de la Castellana, 141. Planta 5, Edificio Cuzco IV28046, Madrid, SpainPhone: 34-91-572-67618-5, Tamura-cho, Atsugi-shi, Kanagawa, 243-0016 JapanPhone: 81-46-296-6509Fax: 81-46-225-8352Am Belvedere 10, A-1100 Vienna, AustriaPhone: 43-(0)1-717-28-7105FL, 235 Pangyoyeok-ro, Bundang-gu, Seongnam-si,Gyeonggi-do, 13494 KoreaPhone: 82-31-696-7750Fax: 82-31-696-7751 AustriaAnritsu EMEA GmbH KoreaAnritsu Corporation, Ltd. United Arab EmiratesAnritsu EMEA Ltd.Anritsu A/S AustraliaAnritsu Pty. Ltd. IndiaAnritsu India Private Limited TaiwanAnritsu Company Inc.Unit 20, 21-35 Ricketts Road, Mount Waverley, Victoria 3149, AustraliaPhone: 61-3-9558-8177Fax: 61-3-9558-8255Office No. 164, Building 17, Dubai Internet CityP. O. Box – 501901, Dubai, United Arab EmiratesPhone: 971-4-37584796th Floor, Indiqube ETA, No.38/4, Adjacent to EMC2,Doddanekundi, Outer Ring Road, Bengaluru – 560048, IndiaPhone: 91-80-6728-1300Fax: 91-80-6728-1301List Revision Date: 202201127F, No. 316, Sec. 1, NeiHu Rd., Taipei 114, TaiwanPhone: 886-2-8751-1816Fax: 886-2-8751-1817210422Printed in Japan 22/APR/2021 ddc/CDT Catalog No. MX0000A-E-A-1-(1.00)Anritsu utilizes recycled paper and environmentally conscious inks and toner. Anritsu All trademarks are registered trademarks of their respectiveowners. Data subject to change without notice. For the most recentspecifications visit: www.anritsu.com11410-00905, Rev. L Printed in United States 2022-01 2022 Anritsu Company. All Rights Reserved.

their performance. Vector Network Analyzers (VNAs) are the optimal instrument to make those measurements. For passive components like connectors, cables, and adapters all that is needed to test them is simple S-parameter measurements. Anritsu handheld Vector Network Analyzers are designed and optimized for fi eld use and are able