Transcription
2011 Proceedings – AnnualReliability and MaintainabilitySymposium(RAMS 2011)Lake Buena Vista, Florida, USA24 – 27 January 2011IEEE Catalog Number:ISBN:CFP11RAM-PRT978-1-4244-8857-5
Table of ContentsSession 01C2011RM0171Bayesian Planning of Optimal Step-Stress Accelerated Life Test Tao Yuan, Ohio University (United States); Xi Liu, Ohio University (United States)2011RM0174Degradation test plan for Wiener degradation processes Julien Baussaron, RENAULT (France); Paul Schimmerling, RENAULT (France); Léo GervilleRéache, University of Bordeaux (France); Mihaela Barreau-Guérin, LASQUO (France)2011RM0102Reliability Growth Test Design; Connecting Math to Physics Milena Krasich, Raytheon (USA)2011RM0291Pseudo-conjugated prior distribution for parametric ALT model Voiculescu Sorin, Bombardier Aerospace (Canada); Guerin Fabrice, LASQUO- University ofAngers, FRANCE. (FRANCE)Session 01D2011RM0024Reliability Prognostics for Electronics via Built-in Diagnostic Tools 1 Tongdan Jin, Texas State University (United States)2011RM0078Modelling Fault Propagation in Phased Mission Systems using Petri Nets Rasa Remenyte-Prescott, University of Nottingham (UK); John Andrews, University ofNottingham (UK)2011RM0085Condition Recognition of Complex System Based on Multifractal Analysis Yanqing Lui, State Key Laboratory for Manufacturing Systems Engineering, Xi'an JiaotongUniversity, Xi'an, Shaanxi, China (China); Jianmin Gao, Manufacturing Quality and SystemsEngineering Institute, School of Mechanical Engineering, Xi'an Jiaotong University (China);
Jiang Hongquan, School of Mechanical Engineering,State Key Laboratory for ManufacturingSystem Engineering (China); Kun Chen, Xi'an Jiaotong University (China)2011RM0031Improving Software and System R&M with Better Error Processing Nathaniel Ozarin, The Omnicon Group Inc. (United States)Session 02C2011RM0218Mastering safety and reliability in a Model Based process Robin Cressent, ENSI Bourges (France); vincent idasiak, prisme (france); frederic kratz, prismeensi de bourges (France); Pierre David, Heudiasyc (France)2011RM0292A Spreadsheet Tool for Managing Probabilistic Risk Assessment Data Gary Epstein, Lockheed Martin Space Systems (usa); Michael Heckwolf, Reliability, LockheedMartin Space Systems (USA)2011RM0113Mitigating technical risks by creative problem solving approaches Alexandra Ottong, Fraunhofer-Institute for Production Technology IPT (Germany); RobertSchmitt, WZL, RWTH Aachen University (Germany); Hans Gut, MAN Turbo AG Schweiz(Switzerland)2011RM0089AVAILABILITY GROWTH. MODELLING AND ASSESSMENT. Zigmund Bluvband, ALD (Israel); Sergey Porotsky, ALD Software (Israel)Session 02D2011RM0037Quantifying the Value of Risk-Mitigation Measures for Launch Vehicles Elisabeth Morse, Valador, Inc. (United States); Joseph Fragola, Valador, Inc. (United States)2011RM0064
Surviving the Lead Reliability Engineer Role in High Unit Value Projects Reinaldo Perez, Jet Propulsion Laboratory (USA)2011RM0076Developing the Stockpile Reliability Program Plan for a New Missile Eric Hunt, US Army Aviation and Missile Research, Development and Engineering Center(USA)2011RM0225Creating an Expert System Risk Assessment Tool for Precursor Analysis Anthony Hall, Information Systems Laboratories (USA)Session 04C2011RM0026Reliability of Multi-State Systems subject to Competing Failures Liudong Xing, University of Massachusetts Dartmouth (United States); Gregory Levitin, IsraelElectric Corporation; University of Electronic Science and Technology of China (Israel)2011RM0029Reliability Growth Planning for Discrete-Use Systems J. Brian Hall, U.S. Army Test and Evaluation Command (United States)2011RM0243Assessing Multi-Layered Social Networks using Reliability Models Kellie Schneider, Univeristy of Arkansas (USA); Chase Rainwater, University of Arkansas(USA); Ed Pohl, University of Arkansas (United States)2011RM0284System Reliability Models with Stress Covariates for Changing Load Profiles Akira Hada, Rutgers University (USA); David Coit, Rutgers University (USA); Mark Agnello,US Navy (USA); Keith Megow, US Navy (USA)Session 05C2011RM0143
System Reliability Assessment as Components Undergo AcceleratedTesting 1 Wei Luo, National University of Defense Technology (China); Chun hua Zhang, NationalUniversity of Defense Technology (China); Xun Chen, National University of DefenseTechnology (China); Yuan-yuan Tan, National University of Defense Technology (China)2011RM0280Reliability Assessments of HCPV Trackers Jon Elerath, SolFocus (USA)2011RM0175Practical applications of Structural Reliability for mechanical Eng. Julio Pulido, Ingersoll Rand (USA)2011RM0147Optimization of the Test Stress Levels of an ADT 1 Jingrui Zhang, (China); Xiaoyang Li, Beihang University (China); Tongmin Jiang, BeihangUniversity (China); Zhengzheng GE, School of Reliabilty and system engneering, BeihangUniversity (China)Session 05D2011RM0129Equipment Degradation Monitoring for Sustained Reliability Edwin Vijay Kumar, VIZAG STEEL (India); SYAMSUNDAR ANNAMRAJU,VISAKHAPATNAM STEEL PLANT (INDIA); Sanjay Chaturvedi, Indian Institute of Technology(India)2011RM0193Sensor Recovery for Robust Multivariate Condition Monitoring Haitao Liao, The University of Tennessee (USA); Jian Sun, University of Tennessee (USA)2011RM0267Hybrid Causal Models for System Diagnostics Chengdong Wang, ASML (USA)2011RM0194Impact of Cartridge Performance on Weapon Reliability & Life Cycle Cost sandy sheng, ATEC (usa)
Session 06C2011RM0177Maintenance of wind turbine systems under continuous monitoring Zhigang Tian, Concordia University (Canada); Tongdan Jin, Texas State University (UnitedStates)2011RM0141Mission Need-based System Supportability Objectives Determination Tailiang Song, Beijing Institute of Technology/University of Massachusetts Dartmouth (China);Liudong Xing, University of Massachusetts Dartmouth (United States)2011RM0170Improving City Sustainability - RAMS Applied to Urban Rail Transit Emil Vlad, Thales Rail Signalling Solutions Canada (Canada); Valeriy Tatarnykov, Thales RailSignalling Solutions (Canada)2011RM0095Developing Competency-Based Engineering Curriculum and Certifications Patrick Dallosta, Defense Acquisition University (United States)Session 06D2011RM0039An Improved Modular Approach for Dynamic Fault Tree Analysis Olexandr Yevkin, Dyadem Int. (Canada)2011RM0061Designing Reliability Demonstration Testing for Repairable Systems 1 Huairui Guo, (USA); Haitao Liao, The University of Tennessee (USA); AthanasiosGerokostopoulos, ReliaSoft (USA); Adamantios Mettas, (USA)2011RM0188Repairable System Modeling of Natural Gas Transmission Networks James Parks, NiSource (USA); John Cox, NiSource (USA)
2011RM0135Optimal Design of Repairable k-out-of-n Systems Considering Maintenance Ramin Moghaddass, University of Alberta (Canada); MIng J Zuo, University of Alberta(Canada)Session 07C2011RM0186Case Study – Risk Management for Medical Devices (Based on ISO 14971) Vaishali Hegde, Philips Respironics (USA)2011RM0263Probabilistic Availability Risk Assessments without Simulation Jan Smith, Independent Consultant (USA)2011RM0073Green Reliability Mike Silverman, Ops A La Carte (USA)2011RM0052New Approach for Risk Analysis and Management in Medical Engineering Thomas Zentis, Fraunhofer Institute for Production Technology IPT (Germany); RobertSchmitt, WZL, RWTH Aachen University (Germany)Session 07D2011RM0144Optimal Resurfacing Decisions for Road Maintenance: A POMD Perspective Mariem Zouch, Ecole des Mines de Nantes / IRCCyN (France); Thomas Yeung, Ecole des Minesde Nantes / IRCCyN (France); Bruno Castanier, Ecole des Mines de Nantes (France)2011RM0197Incorporating Repair Information into Maintenance Optimization Models Elizabeth Lorna Wong, Centre for Maintenance Optimization & Reliability Engineering(CANADA); Andrew Jardine, University of Toronto (Canada); Dragan Banjevic, Centre for
Maintenance Optimization & Reliability Engineering, Department of Mechanical & IndustrialEngineering, University (Canada)2011RM0200Data-Driven Approach for Imperfect Maintenance Model Selection Yu Liu, University of Electronic Science and Technology of China (United States); Hong-ZhongHuang, University of Electronic Science and Technology of China (China); Xiaoling Zhang,University of Electronic Science and Technology of China (China)2011RM0276Comparison of high-availability automation networks Alban PERONNE, ALSTOM Transport Information Solutions (FRANCE); Pierre Dersin,ALSTOM Transport Information Solutions (FRANCE)Session 08C2011RM0086An approach to capture system interaction failures of a complex system Manu Augustine, Malaviya National Institute of Technology (India); Om Prakash Yadav, NorthDakota State University (USA); Rakesh Jain, Malaviya National Institute of Technology (India);Ajay Rathore, Malaviya National Institute of Technology (India)2011RM0125A Method of Quantitative Analysis for Dynamic Fault Tree Zhang Hong-Lin, National University of Defense Technology (China); Zhang Chun-Yuan,National University of Defense Technology (China); Liu Dong, Academy of EquipmentCommand & Technology (China); Li Rui, National University of Defense Technology (China)2011RM0244Degradation Analysis of Solar Photovoltaic Modules Rong Pan, ASU (USA); Joseph Kuitche, ASU (USA); Govindasamy Tamizhmani, ASU (USA)2011RM0281Reliability of Wear-out Items in Electric Motors for Spacecraft Jacob Burke, NASA GSFC (USA); John W Evans, NASA GSFC (USA)Session 08D
2011RM0168Field damage analysis (FDA) concept: analysis of complex damage causes Stefan Bracke, University of Wuppertal (Germany); Stephan Haller, Cologne University ofApplied Sciences (Germany)2011RM0268Case Study – Post Market Product Monitoring System Vaishali Hegde, Philips Respironics (USA); Krishna Konakanchi, Philips Respironics (USA)2011RM0213A novel design of interval prediction for telemetry data Tang Jian, Beijing University of Aeronautics and Astronautics (China); Luan Jiahui, BeijingUniversity of Aeronautics and Astronautics (China); Liu Yalong, Beijing University ofAeronautics and Astronautics (China); Lu Chen, Beijing University of Aeronautics andAstronautics (China)2011RM0116Trend analysis of the power law process with censored data Sharareh Taghipour, Department of Mechanical & Industrial Engineering, University ofToronto (Canada); Dragan Banjevic, Centre for Maintenance Optimization & ReliabilityEngineering, Department of Mechanical & Industrial Engineering, University (Canada)Session 08E2011RM0234ASSESSING THE LIKELIHOOD OF RARE MEDICAL EVENTS IN ASTRONAUTS Jerry Myers, NASA Glenn Research Center (USA); Beth Lewandowski, NASA Glenn ResearchCenter (USA); John Brooker, NASA Glenn Research Center (USA); Aaron Weaver, NASA GlennResearch Center (USA)2011RM0238Predicting the Reliability of a Complex Military System of Systems Carol Vesier, Army Test and Evaluation Command (USA); Angelo Christino, Army Test andEvaluation Command (USA); Brian Hampton, Army Test and Evaluation Command (USA)2011RM0016
A Quantitative Approach for Medical Device Health Hazard Analysis Mingxiao Jiang, (United States); Kathy Herzog, (United States); Thomas Pepin, (United States);Mike Baca, (United States)2011RM0107Engine Fleet Reliability Data Management Optimization John Gebhard, Rolls-Royce Corporation (United States); Jason Boschert, Rolls-RoyceCorporation (United States)Session 09C2011RM0126An ADT Data Evaluation Method of SLD Based on Bayesian Theory 1 Lizhi Wang, Beihang University (China); Xiaoyang Li, Beihang University (China); TongminJiang, Beihang University (China); Junbo Wan, Beihang University ( China )2011RM0204CSADT Life prediction based on DAD using time series method li wang, Beihang University ( China); Xiaoyang Li, Beihang University (China); Tongmin Jiang,Beihang University (China)2011RM0270A Study of Scaling Effect on DRAM Reliability Jin Qin, University of Science and Technology of China (P R China); Mark White, JPL (USA);Joseph Bernstein, Bar-Ilan University (Israel)2011RM0162Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality 1 Zhengzheng GE, School of Reliabilty and system engneering, Beihang University (China);Xiaoyang Li, Beihang University (China); Tongmin Jiang, Beihang University (China); TingtingHuang, Beihang University (China)Session 09D2011RM0121
Allocating Redundancy for Optimal System Reliability and Series MTBF Meng-Lai Yin, Cal Poly Pomona (USA); John Angus, Claremont Graduate University (USA);Rafael Arellano, Raytheon Company (USA)2011RM0181Software Reliability Model with Bathtub-shaped Fault Detection Rate Lance Fiondella, University of Connecticut (USA); Swapna Gokhale, University of Connecticut(USA)2011RM0187FaRBS: a New PoF Based VLSI Reliability Prediction Method Jin Qin, University of Science and Technology of China (P R China); Hava Avshalom, Motorola(Israel); Joseph Bernstein, Bar-Ilan University (Israel)2011RM0206Condition Diagnosis with Complex network based Time Series Analysis Pan Jiacheng, (China); Jiang Hongquan, School of Mechanical Engineering,State KeyLaboratory for Manufacturing System Engineering (China); Jianmin Gao, ManufacturingQuality and Systems Engineering Institute, School of Mechanical Engineering, Xi'an JiaotongUniversity (China); Yang Peilin, Mechanical Engineering,State Key Laboratory forManufacturing System Engineering (China)Session 11C2011RM0068Planning a Reliability Growth Program Utilizing Historical Data 1 Larry Crow, CRR (USA)2011RM0074Birnbaum Importance in Solving Component Assignment Problems Xiaoyan Zhu, University of Tennessee (United States); Qingzhu Yao, University of Tennessee(United States); Way Kuo, City University of Hong Kong (Hong Kong)2011RM0067Special Topics for Consideration in a Design for Reliability Process. Georgios Sarakakis, ReliaSoft (USA); Athanasios Gerokostopoulos, ReliaSoft (USA);Adamantios Mettas, (USA)2011RM0196
Reliability Engineering As a Practical Application to Improving System Performance — FromConcept to System Retirement Sean Carter, NASA JSC (USA)Session 11D2011RM0065Aviation Safety Analysis Based on Man-Machine-Environment Coupling Jin Tian, (P.R.China); Ting di Zhao, (P.R.China); Yang Wu, (P.R.China); Xiao yun Wang,(P.R.China)2011RM0211An Optimization Approach for Safety Instrumented Systems Design Konstantin Machleidt, University of Kaiserslautern (Germany); Lothar Litz, Institute ofAutomatic Control, University of Kaiserslautern (Germany)2011RM0283Human Rating of Launch Vehicles: Historical and Potential Future Risk Joseph Fragola, Valador, Inc. (United States); Benjamin Franzini, Valador, Inc. (USA)2011RM0032Analyzing Interconnection Design Safety Using Bent Pin Analysis Nathaniel Ozarin, The Omnicon Group Inc. (United States)Session 11E2011RM0212Modeling Damage in Large/Heavy Electronic Due to Dynamic Loading Ed Habtour, US Army material Systems Analysis Activity (USA)2011RM0002The Web-Accessible Repository of Physics-based Models (WARP) 2011RM0180Environment-Provoked Early Failures of Mass-Produced Complex Electronics David Verbitsky, Aerotek (USA)
2011RM0248Soft Error Trends and Mitigation Techniques in Memory Devices Charles Slayman, Ops A La Carte (USA)Session 12C2011RM0034Reliability Growth and the Caveats of Averaging: a Centaur Case Study Elisabeth Morse, Valador, Inc. (United States); Joseph Fragola, Valador, Inc. (United States);Blake Putney, Valador, Inc. (United States)2011RM0124Reliability Predictions to Support a Design For Reliability Program Lori Bechtold, Boeing (USA)2011RM0081Dynamic Fault Tree Analysis based on the structure function Guillaume Merle, LURPA, ENS Cachan (France); Jean-Marc Roussel, LURPA, ENS Cachan(France); Jean-Jacques Lesage, LURPA, ENS Cachan (France)2011RM0176Advanced Models for Software Reliability Prediction Zigmund Bluvband, ALD (Israel); MICHAEL TALMOR, RAFAEL Ltd (ISRAEL); SergeyPorotsky, ALD Software (Israel)Session 12D2011RM0269Integrated Developmental/Operational Testing To Evaluate Reliability Jane Krolewski, RAM Directorate, Army Evaluation Center, ATEC (USA); Richard Sullivan,RAM Directorate, AEC, ATEC (USA); Beth Harpel, Manuever Ground Evaluation Directorate,AEC, ATEC (USA)2011RM0241
Modeling The Gain Due To Maintenance Over Transformer Lifespan Jean AUPIED, EDF-R&D (France); Anne BARROS, UTT (France); Yacine GUESSOUM, EDFR&D (France); Antoine Grall, Troyes University of Technology (France)2011RM0275Reliability and Maintainability in Photovoltaic Inverter Design Janet Ma, schneider electric (Canada); Spyros Thomas, schneider electric (canada)2011RM0098A Practical Method for Reliability Analysis of Phased-Mission Systems Suprasad Amari, Parametric Technology Corporation (USA)Session 13C2011RM0036The Art & Practice of Tracking DFMEA Failure Modes Over Time Gary Wasserman, Wayne State University (United States)2011RM0062Using FMECA to Design Sustainable Products Richard Herman, Raytheon Technical Services Company LLC (USA); Keith Janasak, RaytheonSpace and Airborne Systems (USA)2011RM0083Model-driven Automated Software FMEA Neal Snooke, Aberystwyth University (UK); Chris Price, Aberystwyth University (UK)2011RM0133Risk Assessment Using Design Review Based on Failure Mode (DRBFM) Roland Schmidt, ABB Switzerland Ltd (Switzerland); Gernot J. Riedel, ABB Switzerland Ltd.(Switzerland); Klaus Kangas, ABB Oy Drives (Finland)Session 13D2011RM0130
Equipment Health Management through Information Fusion for Reliability Edwin Vijay Kumar, VIZAG STEEL (India); Sanjay Chaturvedi, Indian Institute of Technology(India)2011RM0239Impact of Information on the quality of a Prognostic Indicator Ariane Lorton, EADS (FRANCE); Antoine Grall, Troyes University of Technology (France);Mitra Fouladirad, University of Technology of Troyes (France)2011RM0252Materiel Availability Modeling and Analysis for a Complex Army System Dennis Anderson, Sandia National Laboratories (USA); Matthew Hoffman, Sandia NationalLaboratories (USA); Jeffrey Martin, US Army, CASCOM, Force Development Directorate(USA); David Gunther, US Army, PEO Integration, Logistics Integration (USA)2011RM0119Optimal Spares Analysis for a Networking Systems Manufacturer Daniel Jacob, PTC (USA); Duane Huffman, PTC (USA); Ryan Crytzer, PTC (USA)Session 14C2011RM0055Spare Provisioning for Repairable Systems under Fleet Expansion Loon Ching Tang, Dept of ISyE, National Univ of Singapore (Singapore); Xiao Liu, NationalUniversity of Singapore (Singapore)2011RM0013Lithium Battery Analysis:Probability of Failure Assessment Travis Moebes, SAIC (United States)2011RM0060Optimized Acoustic Microscopy Screen for Multilayer Ceramic Capacitors Andrew Kostic, The Aerospace Corporation (USA); Stanley Schwartz, Lockheed Martin SpaceSystems (USA)2011RM0250Modeling Science Objectives within a Probabilistic Risk Assessment Clayton Smith, Johns Hopkins University Applied Physics Laboratory (USA); Kristen Fretz,
Johns Hopkins University Applied Physics Laboratory (USA); Melissa Jones, Johns HopkinsUniversity Applied Physics Laboratory (USA); Sanae Kubota, Johns Hopkins University AppliedPhysics Laboratory (USA)Session 14D2011RM0112Achieving Reliability Goals for an EFV LRU through Laboratory Testing Neil Loychik, General Dynamics Land Systems (USA); John Pan, Curtiss Wright ControlsElectronic Systems (USA); Erwin Mercado, Curtiss Wright Controls Electronic Systems (USA)2011RM0242Warranty cost optimization in the bidding process and during operation Gisela Lanza, Karlsruhe Institute of Technology, wbk Instiute of Production Science (Germany);Patrick Werner, Karlsruhe Institute of Technology, wbk Institute of Production Science(Germany); Benjamin Behmann, Institute of Production Science (wbk)- Karlsruhe Institute ofTechnology (KIT) (Germany); Dominic Appel, Karlsruhe Institute of Technology, wbk Instituteof Production Science (Germany)2011RM0203Reliability Estimate of Mobile Agent System for QoS MANET Applications CHANDREYEE CHOWDHURY, Jadavpur University (India); SARMISTHA NEOGY,Jadavpur University (India)2011RM0035Improvements In Estimating Software Reliability From Growth Test Data 1 David Dwyer, BAE Systems (United States)Session 992011RM0017Reliability Analysis of Warm Standby Systems using Sequential BDD Ola Tannous, University of Massachusetts Dartmouth (United States); Liudong Xing, Universityof Massachusetts Dartmouth (United States); Joanne Dugan, (United States)2011RM0071
A Systematic Fault Root Causes Tracing Method for Process Systems Xinlin Huang, State Key Laboratory for Manufacturing Systems Engineering, Xi'an JiaotongUniversity (China); Jianmin Gao, Manufacturing Quality and Systems Engineering Institute,School of Mechanical Engineering, Xi'an Jiaotong University (China); Jiang Hongquan, Schoolof Mechanical Engineering,State Key Laboratory for Manufacturing System Engineering(China); Kun Chen, Xi'an Jiaotong University (China)2011RM0096PRA as a Design Tool Diana DeMott, (US)2011RM0108Software Reliability Accelerated Testing Method Based on Test Coverage 1 shuanqi wang, Beihang University, China (China); Yumei Wu, Beihang University (China);Minyan Lu, School of reliability engineering and system of Beihang University (China); HaifengLi, Beihang University, China (China)2011RM0115Fault Tree Analysis Using Stochastic Logic: A Reliable and High Speed Computing Hananeh Aliee, Amirkabir Univ. of Tech. (IRAN); Hamid R. Zarandi, Amirkabir Univ. of Tech.(IRAN)2011RM0185Evaluating down time and maintenance time in communication networks Tatsuya Matsukawa, Nippon Telegraph and Telephone Corporation (Japan); HiroyukiFunakoshi, Nippon Telegraph and Telephone Corporation (Japan); Kohjun Koshiji, NipponTelegraph and Telephone Corporation (Japan) GGLWLRQDO 3DSHU %HVW 3UDFWLFHV 0HWKRGV IRU 5REXVW 'HVLJQ IRU 5HOLDELOLW\ ZLWK 3DUDPHWULF &RVW (VWLPDWHV ( QGUHZ /RQJ 'PLWU\ 7DQDQNR
Lake Buena Vista, Florida, USA 24 - 27 January 2011 IEEE Catalog Number: ISBN: CFP11RAM-PRT 978-1-4244-8857-5 2011 Proceedings - Annual Reliability and Maintainability
