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Page 1 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-04IES LM-80 Test ReportReport Issue Date :August 04, 2016Report Number :I-150206-04-K-04Testing Start Date :April 01, 2015Testing Completion Date : June 26, 2016Revision Number :04Test Duration :9 000 hManufacturer Information :Applicant :Seoul Semiconductor Co., LTDAddress :97-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Description of Test Samples :Classification :LED PackagePKG Name :3030BPart Number :SAWxC22B-xxDrive Current :150 mATest Procedure :IES LM-80-08 Approved Method for Measuring Lumen Maintenance of LED Light SourcesTested byKyungYoung KIM, Research EngineerApproved byYoungJoon WON, Laboratory ManagerThe above testing certificate is the accredited test result byKorea Laboratory Accreditation Scheme, which signed the ILAC-MRA.Seoul Semiconductor Testing Laboratory97-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Accredited by KOLAS, Republic of KOREAThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor
Page 2 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-04Applicable Series Model NumbersThis LM-80 report is applicable to the 5 3030BSAWxCF2B-xx3030BSeriesModel NumberTypical VFPowerCCT3030B20 mA48.0 V0.96 W 2700 K85 20 mA48.0 V0.96 W 2700 KSAWxCF2B-xx105 20 mA48.0 V0.96 W 2700 K3030BSAWxC72B-xx55 45 mA21.0 V0.95 W 2700 K3030BSAWxC72B-xx85 45 mA21.0 V0.95 W 2700 K3030BSAWxC72B-xx105 45 mA21.0 V0.95 W 2700 KThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor
Page 3 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-041. Test SummaryNominal Case TemperatureItems55 85 105 202020Drive Current150 mA150 mA150 mAMeasurment Current150 mA150 mA150 mATest Duration9 000 h9 000 h9 000 hActual Case Temperature 53.0 83.7 103.0 Actual Ambient Temperature 51.2 81.2 100.3 0.78 m/s 0.48 m/s 0.14 m/s104.6 lm103.7 lm103.5 lmAveraged Initial CCT2733 K2748 K2736 KAveraged Forward Voltage6.64 V6.65 V6.65 VAveraged Lumen Maintenance98.6 %97.6 %95.5 %Averaged Chromacity Shift0.000 60.001 30.002 21 Projection L70(419000) 54000 54000TM-21 Projection L80(255000) 54000 54000TM-21 Projection L90(110000) 5400030000Number of LED testedAir Flow VelocityAveraged Initial Luminous Flux※ The results shown in this certificate refer only to the sample(s) tested unless otherwise stated.This test report cannot be reproduced, except in full.L11055 SetLumen ProjectionL10585 Set105 SetL100L95L90L85L80L75L701,00010,000100,000The certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor1,000,000
Page 4 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-042. IES LM-80-08 Test Report Requirement :Number of LED Light Sources TestedSee the Test SummaryDescription of LED Light SourcesSee the Description of Test samples at the cover of certificateDescription of auxiliary equipmentActive cooling Test SystemTemperature controlling chamber for LED package/array/module consists of the watercooling heat-sink plates to control the case temperature of each device and of thepower supply required by LM-80 test conditions.Measurement SystemPhotometric measurement tester for LED package/array/module consists of theintegrating sphere with temperature controlling system(TEC) and of programmablecurrent source meter.Operating CycleConstant Direct Current (DC)Ambient Conditions Including Airflow, Temperature and Relative HumidityAirflow : 1 m/sAmbient temperature : -5 of Nominal TA( See the Test Summary for actual TA )Relative Humidity : 65% RHCase Temperature (Test Point Temperature)See the figure below, for the case temperature (TS) measurement point and dimensionCase Temperature Measurement PointPackage DimensionThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor
Page 5 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-04Drive Current of the LED Light Source During Lifetime TestSee the Test SummaryInitial Luminous Flux and Forward Voltage at Photometric Measurement CurrentSee the Test SummaryLumen Maintenance Data for Each Individual LED Light Source Along with Median Value,Standard Deviation, Minimum and Maximum Lumen Maintenance Valuefor All of the LED Light SourcesSee the table of each data setObservation of LED light Sources FailuresNo failure observedLED Light Source Monitoring IntervalSee the table of each data setPhotometric Measurement UncertaintySeoul Semiconducr maintain a tolerance of 3.04 % at 95% confidence level (k 2)Chromaticity Shift Over the Measurement TimeSee the table of each data setThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor
Page 6 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-043. 55 Data SetNo.Initial CharacteristicsVf (V)Flux (lm) CCT (K)Lumen Maintenance1000 h2000 h3000 h4000 h5000 h6000 h7000 h8000 h9000 425Lumen h5000h6000h7000hThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor10000h
Page 7 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-043. 55 Data SetInitial CharacteristicsNo.Chromaticity Shift du'v'CIE1976 u'CIE1976 v'1000 h2000 h3000 h4000 h5000 h6000 h7000 h8000 h9000 0020.00022122232425Chromaticity 0h4000h5000h6000h7000hThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor8000h9000h10000h
Page 8 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-043. 85 Data SetNo.Initial CharacteristicsVf (V)Flux (lm) CCT (K)Lumen Maintenance1000 h2000 h3000 h4000 h5000 h6000 h7000 h8000 h9000 60.60.70.70.60.88000h9000h2122232425Lumen h5000h6000h7000hThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor10000h
Page 9 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-043. 85 Data SetInitial CharacteristicsNo.Chromaticity Shift du'v'CIE1976 u'CIE1976 v'1000 h2000 h3000 h4000 h5000 h6000 h7000 h8000 h9000 0020.00042122232425Chromaticity 0h4000h5000h6000h7000hThe certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor8000h9000h10000h
Page 10 of 1197-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea 15429Report No. : I-150206-04-K-043. 105 Data SetNo.Initial CharacteristicsVf (V)Flux (lm) CCT (K)Lumen Maintenance1000 h2000 h3000 h4000 h5000 h6000 h7000 h8000 h9000 8.398.295.696.
IES LM-80-08 Test Report Requirement : Number of LED Light Sources Tested See the Test Summary Description of LED Light Sources See the Description of Test samples at the cover of certificate Description of auxiliary equipment The certificate shall not be reproduced, except in full, without permission of Seoul Semiconductor. 97-11, Sandan-ro 163, Danwon-gu, Ansan, Gyeonggi-do, Korea
