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COMMUNICATIONS TEST & MEASUREMENT SOLUTIONSONT-50Optical Network TesterKey features Combines digital and optical test capabilities SONET/SDH from 52 Mb/s to 10.7 Gb/swith electrical and optical interfaces Complete testing solution for OTU1 and OTU2 High-accurate Jitter/Wander test 10/10.7G according tonew ITU-T O.172 Appendix VII VIII First EoS interworking tester up to 10 Gb/s Electrical and optical Ethernet testing Single and dual port DSn/PDH modules Unique dual port OSAs ready for 40/43 Gb/s signal analysiswith channel drop up to 10.7 Gb/s Multiuser remote use through innovative web browserinterface Supports multiple applications simultaneouslyFebruary 2006 EditionTesting design and conformance of Next Generation TransportNetworksNext Generation SONET/SDH equipment plays a key role in today’s’ networks. It allows for efficient handling of data, voice and video traffic (triple play). This is addressing the needs of serviceproviders to transport services like “bandwidth optimized” Ethernet over the widely deployedSONET/SDH networks.New installations of broadband links today are frequently done with OTN technology. With its’Forward Error Correction (FEC) it increases the fault acceptance capability of a high speed link,thus providing a higher transmission quality or possible longer links.DWDM is still another great enabler of increased bandwidth by optical multiplexing of multiplehigh speed links.As a result, companies are increasingly require advanced testing solutions that are able to combineall necessary test applications and enable quick time to market of their products.The ONT-50 is a flexible, four slot, mainframe test solution with broadest range of digital and optical application modules. Modules to test are OTN, SONET, SDH, PDH, NewGen, Ethernet, Jitteras well as a variety of Optical Spectrum Analyzers.The ONT-50 allows a free combination of all available testing modules which can be shared amongmultiple users simultaneously. Drivers and test libraries support Tcl/Tk and LabWindows to minimize efforts to use ONT-50 in an automated environmentWEBSITE: www.jdsu.com

ONT-50 Optical Network Tester2Design and conformance testing of NextGeneration transport networksMulti-application and multi-port configurationEoS interworkingDSn/PDH modules Unframed, framed and muxed DSn andPDH signals Single and dual portNewGen solution 2.5/10G Ethernet over SONET/SDH (EoS) Ethernet MAC LCAS, GFP, differential delay GFP-T (optional, 2.5G only) SONET/SDH (PoS optional)Ethernet modules Optical and electrical interfaces Ethernet MAC Ethernet linkModules 2.5G/10G/10G-B SONET/SDH (PoS optional) Jitter/wander for version -B (optional)OTN modules 10/10.7G (-B) OTN SONET/SDH (PoS optional) Jitter/wander for version -B (optional)Jitter module 10G-B, 10/10.7G-B High-accuracy jitter evaluated withO.172 Appendix VII VIII Adds jitter to 10G modules Adds jitter to OTN module 10/10.7G Wander (optional)OTN module 2.5/2.7G OTN SONET/SDH (PoS optional)DWDM analyzer Optical spectrum analysis EDFA test DFB, FP, LED tests Drop option up to 10.7 Gb/sONT-50 4 slots to take any combination ofmodules 12” TFT displayOptical amplifier module Amplifier C/L band

ONT-50 Optical Network Tester3Configuration guideONT-50 mainframe, 4 slots, 12” TFT displayModules and optionsBN 3070/01Slots requiredPageDSn/PDH applicationDSn/PDH module single port1BN 3070/90.615DSn/PDH module dual port1BN 3070/90.6251BN 3070/90.187SONET/SDH/PoS applicationsModule 2.5G, 1310 & 1550 nm/electricalModule 2.5G, 1310 nm1BN 3070/90.807Module 10G, 1310 nm1BN 3070/90.158Module 10G, 1550 nm1BN 3070/90.168Module 10G-B, 1310 nm/electrical2BN 3070/90.218Module 10G-B, 1550 nm/electrical2BN 3070/90.198PoS processing–BN 3070/93.0311Data over SONET/SDH applicationsNewGen solution 2.5 G, 1310 & 1550 nm/electrical1BN 3070/90.4112NewGen EoS interworking(NewGen solution 2.5G Mixed Ethernet module)2BN 3070/90.4212NewGen solution 10G, 1550 nm/electrical2BN 3070/90.4512GFP-T processing–BN 3070/93.0817Ethernet 10/100/1000 M – 4 ports twisted pair1BN 3070/90.7120Mixed Ethernet module – 2 ports 10/100/1000, 2 ports 1G1BN 3070/90.7221Ethernet module 1G – 4 ports 1G1BN 3070/90.7321OTN/SONET/SDH/PoS applicationsOTN module 2.5/2.7 G – 1310/1550 nm/electrical1BN 3070/90.1723OTN module 10/10.7G – 1550 nm2BN 3070/90.3023OTN module 10/10.7G-B – 1550 nm/electrical2BN 3070/90.3223OTN module 10/10.7G-B – 1310 nm/electrical2BN 3070/90.3323Jitter module 10G-B1BN 3070/90.9526Jitter module 10/10.7G-B1BN 3070/90.9326Wander 10/10.7G–BN 3070/93.9127Jitter/Wander applicationsOptical applicationsOptical amplifier module OAM-200 (C-band)1BN 3070/92.2029Optical amplifier module OAM-201 (C/L-band)1BN 3070/92.2129DWDM analyzer OSA-160, single port2BN 3070/91.0129DWDM analyzer OSA-161, single port & drop2BN 3070/91.1230DWDM analyzer OSA-201, dual port & drop2BN 3070/91.1430High performance DWDM OSA-300, single port3BN 3070/91.3131High performance DWDM OSA-301, single port & drop3BN 3070/91.3231High performance DWDM OSA-303, dual port & drop3BN 3070/91.3431PMD test kit1BN 3070/91.1132

ONT-50 Optical Network Tester4ONT-50 mainframeThe ONT-50 is a four-slot mainframe test solution with field upgradablemodules. It can be equipped with digital test modules for SONET/SDH/OTN/PoS and NewGen and Ethernet analysis. Optical test modules foroptical spectral analysis (OSA) and optical amplifier modules (OAM)are also available thus allowing for simultaneous multi-application andmulti-port measurements.Calibration interval24 monthsPower supply (nominal range of use)100 to 240 V50/60 Hzmax. 400 VAclass IAmbient temperature600, 690, 895C, 900Printer level 1Further printouts are available in the corresponding application books.Touchscreen displayColor TFT screenResolution12.1”, 65536 colors800 600 pixels (SVGA standard)The touchscreen allows for simple point and shoot operation.Nominal range of use 5 to 40 C/41 to 104 FStorage and transport range 20 to 60 C/ 4 to 140 FDimensions (w/h/d) approx. 13.8/12.7/8.3 in approx. 350/323/211 mmWeight (includes protective cover without modules) approx. 22 lb/10 kgClock and synchronization of digital test modulesInternal master clock accuracy(meets T1.101 stratum 3/3E accuracy)Screen copy printPrinting of screen picture via the ONT-50 parallel port and USB.Supported printers:HP Desk Jet SeriesPostscriptGeneral specificationsAC line voltageAC line frequencyPower consumptionSafety class to IEC 61010-1Save, load, export and importCurrent instrument settings and measurement results can be saved oninternal HD, and re-loaded at a later date. Alternatively, the settings/results can be exported to floppy disk or remote LAN for further processing (report documentation and printouts) and imported onto the sameor another ONT-50.4.6 ppmExternal synchronization* 50/75 Ω, unbalanced, BNC jack:– Reference clock: 1 MHz, 1.544 MHz, 2.048 MHz, 5 MHz, 10 MHz–Reference clock accuracy: 50 ppm* 100/120Ω, balanced, Bantam jack– E1 (HDB3) 2.048 Mb/s, DS1 (B8ZS/AMI scrambled) 1.544 Mb/s– Offset acceptance 50 ppm* Receive signalClock outputs50 Ω, unbalanced, BNC jack, TTL level 1.544 MHz clock 2.048 MHz clockInstrument operationInterfacesParallel port, serial port, PCMCIA port, floppy disk drive, Ethernet(RJ‑45), VGA connectorMulti-user remote via LAN (remote operation)In LAN environments, the ONT-50 can be operated interactively viaTCP/IP and a standard browser. The ONT-50’s multiuser capabilityoffers flexible use of the instrument, allowing several users to access themodules of a single unit. The user interface can be displayed simultaneously on local terminals and in parallel on the ONT. Multiple ONTs canalso be operated simultaneously from a single PC.Remote control for test automationThe ONT-50 is controlled remotely via SCPI commands sent by thecustomer’s program using an Ethernet TCP/IP connection. Modules areaddressed independently and in parallel and may be shared among multiple users. Universal driver libraries facilitate automation with specificsupport for individual applications. Scripting support via Tcl/Tk librariesand LabWindows drivers.The interactive GUI also works in parallel to remote control, thusenabling the development of automated scripts easily.

ONT-50 Optical Network Tester5Digital test modulesDS1 InterfaceJDSU offers a complete line of optical test adapters for all optical interfaces. All optical interface options include the required number of selectabletest adapters.RecommendationsLine rate, codesConnectors, balancedunbalancedT1.102-1993, G.7031.544 kb/s, B8ZS, AMIBantam/100 Ω, RJ-48c/120 ΩBNC/75 ΩTransmitter DS1DSn/PDH applicationsHighlights DSn/PDHOutput level balanced0 dBdsx/6 Vppunbalanced4.74 VppOutput waveformpre-equalized 0.6, 1.2, 1.8, 2.4, 3.0 dBdsxft: 0 to 133, 133 to 266, 266 to 399, 399 to 533, 533 to 655 Two independent portsReceiver DS1 Multiplex chains DS1/DS, E1/E4 andmixed mux DS1/E1 in DS3ModesTerminate, Monitor, BridgeSensitivity Terminate 6 dB cableMonitor-30 dB/0dB cable , -26 and -23 dB/ 6 dB cableBridge balanced input ( 1 kΩ) 6 dB cableOffset acceptance 180 ppmE1 InterfaceRecommendationLine rate, codesConnectors, balancedunbalancedG.7032.048 kb/s, HDB3, AMIRJ-48c/120 Ω, Bantam/100 ΩBNC/75 ΩTransmitter E1Output level balancedunbalanced6 Vpp4.74 VppReceiver E1ModesTerminate, Monitor, BridgeSensitivity Terminate 6 dB cableMonitor-30 dB/0 dB cable , -26 and -23 dB/ 6 dB cableBridge balanced input ( 1 kΩ) 6 dB cableOffset acceptance 80 ppmE3 InterfaceDSn/PDH Modules single port and dual portHardware option BN 3070/90.61, BN 3070/90.62 – 1 slot eachThe module supports all DSn/PDH rates on each port independently.It provides unframed, framed and structured signals with overheadaccess and error and alarm insertion and analysisClocking all ratesClock sourcesInternal clock accuracyInternal clock pulling rangePulling stepinternal, recovered from RXas per mainframe clock 500 ppm0.1 ppmInterface measurementsFrequency measurementLevel measurementAlarmsAlarm insertionTriggeringBurstM, N 500 ppmmVppLOS, Overload, Frequency out of rangeTX LTI (TX Loss of timing information)LOScontinuous, burst once, burst continuousM bits/msecs alarm on, N bits/msecs alarm off1 to 16.777.215 bitsRecommendationLine rate, codesConnector, unbalancedG.70334.368 kb/s, HDB3, AMI (TX only)BNC/75 ΩTransmitter E3Output level2 VppReceiver E3ModesSensitivity TerminateMonitorOffset acceptanceTerminate, Monitor 12 dB cable-20 dB/ 12 dB cable, -26 dB/ 6 dB cable 100 ppmDS3 InterfaceRecommendationsLine rate, codesConnector, unbalancedT1.102-1993, G.70344.736 kb/s, B3ZS, AMI (TX only)BNC/75 ΩTransmitter DS3Output level HIGHDSXLOW0 ft cable/2.0 Vpp450 ft cable/1.0 Vpp900 ft cable/0.5 Vpp

ONT-50 Optical Network Tester6DS1, DS3 framedReceiver DS3ModesSensitivity TerminateMonitorOffset acceptanceTerminate, Monitor 12dB cable-20 dB/ 12dB cable, -26 dB/ 6 dB cable 100 ppmE4 InterfaceRecommendationsLine rate, codeConnector , unbalancedG.703139.264 kb/s, CMIBNC/75 ΩTransmitter E4Output level1 VppModesSensitivity TerminateMonitorOffset acceptanceTerminate, Monitor 12 dB cable-20 dB/ 6 dB cable, -26 dB/0 dB cable 100 ppmDSn/PDH testingFormat16bits programmable and displayed onlineincludes synchronization messageOverhead bits DS3X1, X2, C11-/ AIC-bitdisplayed onlineMultiplex ChainsStandard test patternPRBS 15, 20, 23, 31 (normal and inverted)16 bit user selectable, all 0s, all 1sbit pattern with programmable length 3 to 32 bitE1, E3, E4 (PDH) unframedPatternAlarmsAlarms E1 onlyErrorsErrors E1& E3 onlyStandard test patternLOS, AISExcessive zerosBit errorCodeDS1, DS3 unframedPatternSpecial pattern DS1 onlyAlarmsAlarms DS1 onlyErrorsStandard test patternQRSS20, 1 in 8, 2 in 8, 3 in 24LOSAIS, Excessive zerosBPV, Bit errorE1, E3, E4 (PDH) framedFrame types E1 (E1 is not channelized)Frame types E3, E4PatternAlarmsAlarms E1 onlyErrorsErrors E1 onlyErrors E1& E3 onlyPCM30, PCM30 CRCPCM31, PCM31 CRCG.751Standard test patternLOS, AIS, LOF, RDIExcessive zerosFAS word/bit, Bit errorCRC, REBECodeOverhead bits E1Si, Sa4 to Sa8CAS TS16 (PCM30 only)SSM (PCM30/31 CRC only)programmable and displayed onlineprogrammable 16 byte sequenceclear text edit and displayOverhead bits E3, E4E3 Bit12E4 Bit14 to 16SF, ESFC-Parity, M13Standard test patternQRSS20, 1 in 8, 2 in 8, 3 in 24100LOS, AIS, Frame loss, RAI, IdleExcessive zerosFTM (Frame Type Mismatch)BPV, Frame errors, Bit errorCRCP-bit, CP-bit, FEBEData link DS1 ESFReceiver E4PatternFrame types DS1Frame types DS3PatternSpecial pattern DS1Special pattern DS3AlarmsAlarms DS1 onlyAlarms DS3 onlyErrorsErrors DS1 onlyErrors DS3 onlyprogrammable and displayed onlineprogrammable and displayed onlineE-carrier muxE3 structuredE4 structuredE1 in E3 via E2E1 in E4 via E2/E3E1 is unframed or framed, not channelized.One selected channel is generated and one is measured. Background channels are fully structuredT-carrier muxDS3 structuredDS3 structuredDS1 in DS3 via DS2E1 in DS3 via ES2DS1 is unframed or framed, not channelized. One selected channel isgenerated and one is measured. Background channels are fully structuredMixed muxDS3 mixedDS1 via DS2 and E1 via ES2DS1 and E1 are unframed or framed, not channelized. One selectedchannel DS1 and one E1 are generated and one of each is measured (dualchannel measurement). Background channels are fully structured

ONT-50 Optical Network Tester7ES2 framing testingFrame typeAlarmsErrorsOH Reserved bit SE1 in DS3 comply G.747AIS, LOF, RDIFAS word/bitprogrammable and displayed onlineBit rate offsetsMeasurementoffsets of all mux levelsHardware modulesModule 2.5G, 1310nmModule 2.5G, 1310/1550nmNewGen Solution 2.5G, 1310/1550nmOTN Module 2.5/2.7G, 1310/1550nmHardware options – 1slot eachDSn/PDH error/alarm insertion and measurementSimultaneous generation of errors and alarms is supportedAlarm insertionTriggeringBurstM, NError insertionTriggeringRatesBurstM,Nalarms see correspondent signalcontinuous, burst once, burst continuousM bits/msecs alarm on, N bits/msecs alarm offdepend on signal typeerrors see correspondent signalsingle, rate, burst once, burst continuousrate burst once, rate burst continuous9.9E-3 to 1.0E-10M errored frames followed by N error free framesin frames/µsAlarm detectionalarms see correspondent signalsAll alarms are measured with durationError detectionerrors see correspondent signalsAll errors are measured with count, ratio and durationModule 2.5G, 1310 nmModule 2.5G, 1310/1550 nm, electrical interfacesNewGen Solution 2.5, 1310/1550 nm, electrical interfacesOTN Module 2.5/2.7G, 1310/1550 nm, electrical interfacesBN 3070/90.80BN 3070/90.18BN 3070/90.41BN 3070/90.17Tests supported SONET/SDH from 52 Mb/s to 2.5 Gb/s (page 8) EoS (NewGen solution only, page 12) OTU-1 testing (OTN module only, page 24) PoS (optional, page 11)GeneralLine rates2.488 Gb/s, 622/155/52 Mb/s2.666 Gb/s (OTN module only)scrambled NRZLine codeClock generatorClock accuracy and synchronization from external signal: see clockspecifications of ONT-50 mainframeSONET/SDH applicationsSelectable clock offsetStep sizeHighlights SONET/SDHOptical InterfaceThe interface meets the specification of ITU-T G.957 / GR.253 Dynamic error/alarm insertion including pulse bursts Best-in-class service disruption test with high level of detailsand user-accessible settings – no blind spots 50 ppm0.1 ppmGeneratorWavelengthsOutput level1310 & 1550 nm 2 to 3 dBmReceiverWavelength rangeRx offset acceptance1260 to 1360 nm, 1430 to 1580 nm 100 ppmSensitivityall ratesadditionally at 155M, 52MMaximum input power (destructive)Optical power measurement 8 to 28 dBm 8 to 34 dBm 3 dBm 8 to 34 dBmElectrical interfaces (except BN 3070/90.18)50 Ω, AC coupledSMAImpedanceConnector typeGenerator data signalBit ratesCodeOutput level52 Mb/s to 2.488 Gb/s, 2.666 Gb/s (OTN module only)scrambled NRZ 200 mVpp

ONT-50 Optical Network Tester8Generator clock signalReceiver 1310 nmBit ratesEye clockOutput levelWavelength range mSensitivityMax. input power (destructive power)Measuring optical input power52 Mb/s to 2.488 GHz, 2.666 GHz (OTN module only)fclock/4 200 mVppReceiver data signalBit rates52 Mb/s to 2.488 Gb/s, 2.666 Gb/s (OTN module only)Input level, code200 to 1000 mVpp, scrambled NRZReceiver clock signalRecovered clockInput levelfclock/4 200 mVpp622 MHzsinusoidal 200 mVppElectrical interfaces (except BN 3070/90.15, /90.16)AC coupled 50 WSMAImpedanceConnector type9.951 Gb/s, scrambled NRZ 200 mVppGenerator clock signalModule 10G, 1310 nmModule 10G-B, 1310 nm/electrical interfacesModule 10G, 1550 nmModule 10G-B, 1550 nm/electrical interfacesNewGen Solution 10G, 1550 nm/electrical interfacesBit rateOutput levelBN 3070/90.15BN 3070/90.21BN 3070/90.16BN 3070/90.19BN 3070/90.45Tests supported SONET/SDH 10Gb/s (page 8) EoS (NewGen solution only, page 12) PoS (optional, page 11) Jitter/wander for versions –B (optional)9.951 GHz 200 mVppReceiver data signalBit rate, codeInput level9.951 Gb/s, scrambled NRZ100 to 600 mVppSONET/SDH testingSignal StructureSONET mappingsVT 1.5/ 2/ 6, STS 1/ 3c/ 12c/ 48cFor module 10G onlySTS 192cSDH mappingsAU-4: VC-12, VC-11, VC-2, VC-3, VC-4, VC-4-4c/16cAU-3: VC-12, VC-11, VC-2, VC-3For module 10G onlyVC-4-64cGeneral9.953 Gb/s, scrambled NRZClock generatorClock accuracy and synchronization from external signal: see clockspecifications of ONT-50 mainframe 50 ppm0.1 ppmSelectable clock offsetStep sizeOptical interfacesThe interface meets the requirements of ITU-T G.691/GR.253Generator1550 nm 3 to 2 dBm1310 nm 4 to 0 dBmReceiver 1550 nmWavelength rangeSensitivityMax. input power (destructive power)Measuring optical input powerBit rateOutput levelBit rate, codeOutput levelHardware options 90.15 and 90.16 – 1 slot eachHardware options others – 2slot eachWavelengthOutput level 1550 nmWavelengthOutput level 1310 nmGenerator eye clock signalGenerator data signalModule 10G (-B), 1310nmModule 10G (-B), 1550nmNewGen Solution 10G, 1550nmLine rate, code1290 to 1330 nm 3 to 12 dBm0 dBm 14 to 0 dBm1530 to 1565 nm 3 to 14 dBm 2 dBm0 to 14 dBmPayload* Test pattern without stuffing bits (Bulk O.181)* Unframed DSn/PDH test pattern* Framed and muxed DSn/PDH signals (refer to page 6)Test pattern* 215 1/ 223 1/ 231 1 (ITU and inverted),* 16 bit user selectable word* “Traffic” mode: the content of the containers is ignored thus allowinganalysis of live traffic.

ONT-50 Optical Network Tester9Background channelsIdentically structuredFill pattern independent from test pattern* 215 1/ 223 1/ 231 1 (ITU and inverted),* 16 bit user selectable wordMeasurementsError measurement SONET/SDHBit errors, FAS, B1, B2, MS-REI/REI-L, B3, HP-REI/REI-P, LP-BIP/BIPV, LP-REI/REI-VAll errors, count, ratio, secondsAlarm detection SONET/SDHSONET:LOS, SEF, LOF, AIS-L, RDI-L, LOP-P, AIS-P, RDI-P, UNEQ-P,LOM, AIS-V, RDI-V, RFI, LOP-V, UNEQ-V, PDI-V, Pattern lossSDH: LOS, OOF, LOF, MS-AIS, MS-RDI, AU-LOP, AU-AIS, HP-RDI, HP-UNEQ,TU-LOM, TU-AIS,LP-RDI, LP-RFI, TU-LOP, LP-UNEQ, Pattern lossResolution100 msEvent measurement DSn/PDHPlease refer to page 6, DSn/PDH testing.Result display of errors and alarmsNumerical displayCount, ratio and seconds are displayed for each error, seconds are displayed for each alarm.Tabular displayDisplay of all results with time stamps: start, stop, duration/countGraphical displayEvents are displayed as bar graphs versus time. Cursors allow for easyidentification and zooming-in on the results. Filters enable event selection. Time axis second, minute, hourMeasurement intervalThe application can be started and stopped manually or automaticallywith the use of a timer.Measurement stop intervals are 1 min, 15 min, 1 h, 24 h, 72 h, 96 h or userdefinable.Service disruption testThe ONT-50 provides one of the most comprehensive Service Disruption Tests available.In synchronous networks, Automatic Protection Switching (APS) is usedto switch traffic to backup links if faults oc

WEBSITE: www.jdsu.com Key features COMMUNICATIONS TEST & MEASUREMENT SOLUTIONS . Optical Network Tester. ONT-50 Optical Network Tester 2 . DWDM analyzer OSA-161, single port & drop 2 BN 3070/91.12 30 DWDM analyzer