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liatWeathering Testing for Electronic ComponentsneIEC 60068-2-5idfnoCbaLQBill Tobin– Senior Technical Marketing SpecialistAndy Francis – Marketing DirectorDave Duecker – Technical Marketing SpecialistSean Fowler –Technical Director, Weathering and CorrosionQ-Lab CorporationClick here to view the presentation.Weathering Testing forElectronic Components1
HousekeepingYou’ll receive a follow-up email frominfo@email.q-lab.com with links to a survey,registration for future webinars, and todownload the slidesfnoC Our archived webinars are hosted at:q-lab.com/webinars Use the Q&A feature in Zoom to ask usquestions today!baLQWeathering Testing forElectronic Componentseid2tnlia
Testing ElectronicseidtnbaLQWeathering Testing forElectronic ComponentsfnoC3lia
Backgroundeidtnlia IEC 60068-2-5 (1975)First Solar Simulation Test for ElectronicsbaLQWeathering Testing forElectronic ComponentsfnoC4
liaIEC 60068 (IEC 68)Environmental Testing of ElectronicseidtnfnoC Series of standards designed to help withenvironmental testing of electronicsbaLQ Cover dozens of topics, including temperature,vibration, impact, salt mist, and weatheringWeathering Testing forElectronic Components5
IEC 60068 (IEC 68)tneid Broken into 3 partsfnoClia IEC 60068-1: General and Guidance IEC 60068-2-X: Tests IEC 60068-3-X: Supporting DocumentationbaLQWeathering Testing forElectronic Components6
MIL STD 810liatn Similar to IEC 60068, this is a seriesofedphysical/environmental teststo be performedifnon the component/productlevel foroelectronics.CbaL Only 1 standard*QEnvironmental Engineering Considerationsand Laboratory Tests*1089 pagesWeathering Testing forElectronic Components7
liaMIL STD 810C Method 505.1 (1975)eidtnPurpose. The sunshine test is conducted todetermine the effect of solar radiation energy onequipment in the Earth’s Atmosphere. For thepurpose of this test, only the terrestrial portionof the solar spectrum is considered baLQWeathering Testing forElectronic ComponentsfnoC8
Fist Iteration Testingeidtn These tests were limited based on theequipment available at the timefnoC– Mercury Vapor Lamps– Carbon Arc Lamps– Xenon Arc Lamps– Multivapor lampsbaLQWeathering Testing forElectronic Components9lia
Limitationseidtnlia While these were primarily designed forthermal loading, many used this test tosimulate degradation As specified, UV light was not highlycontrolled compared to the full spectrumbaLQWeathering Testing forElectronic ComponentsfnoC10
DIN 75220liatnMIL STD Related, but not the same as IECeandd Designed specifically for automotiveifncomponentsoC Uses a similar spectrumfor daylight test, butbalso has moreextreme nighttime conditionsaLQAgeing of Automotive Components in Solar Simulation UnitsWeathering Testing forElectronic Components11
liaTemperature vs. Durability Testingtn Electronics have different end userequirements, so the significance of thesesimulation tests varied.eidbaLQ– Thermal Loading– DegradationWeathering Testing forElectronic ComponentsfnoC12
Forces of WeatheringSunlightbaLQHeatliafnoCtWaterneidWhich of these are being tested by these methods?Weathering Testing forElectronic Components13
ProceduresbaLQWeathering Testing forElectronic ComponentstneidMIL STD 810 Method 505 Procedure A– Temperature Procedure B– Actenic EffectsliaIEC 60068-2-5 Sa 1 – Temperature Sa 2 – Temp & Durability Sa 3 – Durability Sb 1 – Weathering Sb 2 – Weathering(behind glass)fnoC14
tnliaeidfChallenges and TestTailoringnoCbaLQWeathering Testing forElectronic Components15
liaChallenges to these Methodstneid Solar Thermal Loading puts an emphasis onlongwave visible and infrared (IR) radiationfn Most weathering testsodo not control the IRCrange, and lampaging can cause fluctuationbaLQWeathering Testing forElectronic Components16
eidtnbaLQWeathering Testing forElectronic ComponentsfnoC17lia
Test Tailoringliaeidtn In order to compensate for many differenttests for many different specimens, a test maybe tailored based on the equipment availableand the parameters of interestfnoCba(MIL LSTD810 Part 1 and IEC 60068-1)QWeathering Testing forElectronic Components18
liaMIL STD 810 on Test TailoringeidtnThe primary emphases are tailoring a materiel item'senvironmental design and test limits to the conditionsthat the specific materiel will experience throughout itsservice life, and establishing laboratory test methodsthat replicate the effects of environments on materiel,rather than trying to reproduce the environmentsthemselves.baLQWeathering Testing forElectronic ComponentsfnoC19
liaMIL STD 810 on Test TailoringeidtnIt is important to emphasize that these methods arenot to be called out in blanket fashion, nor applied asunalterable routines, but are to be selected and tailoredto generate the most relevant test data possible.baLQfnoCBased on this and other language in the standard, Q-Labbelieves that Xenon Arc testing with controlled UV produces thebest method of replicating real world effectsWeathering Testing forElectronic Components20
liaTailored Q-SUN Filters/setpointseidtnbaLQWeathering Testing forElectronic ComponentsfnoC21
eidtnaLQWeathering Testing forElectronic ComponentsfTest CyclesnoCb22lia
IEC 60068-2-5 Cycles Sa 1 – Diurnal CycleeidfnoC Used for thermal cyclicbtestingaLQ8 hours of light, 40 C (air)16 hours of darkness 25 CWeathering Testing forElectronic Components23tnlia
IEC 60068-2-5 Cycles Sa 2 – Extended LightbaLQ Used for testingdegradation effectsWeathering Testing forElectronic ComponentseidfnoC20 hours of light, 40 C (air)4 hours of darkness 25 C24tnlia
IEC 60068-2-5 Cycles Sa 3 – Continuous Light Used for testingphotochemical effectsonlybaLQWeathering Testing forElectronic ComponentseidfnoC24 hours of light, 40 C (air)25tnlia
IEC 60068-2-5:2018Weatheringliaeidtn In 2018, specific weathering cycles were added forusers interested in full weathering testingfnoC For those familiar, these are the same cycles andfilter definitions found in ISO 4892-2 (Weathering ofPlastics)baLQWeathering Testing forElectronic Components26
liaIEC 60068-2-5 Weathering CycleseidtnbaLQWeathering Testing forElectronic ComponentsfnoC27
MIL STD 810H Procedure IeidtnbaLQWeathering Testing forElectronic ComponentsfnoC28lia
MIL STD 810H Procedure IIeidtnbaLQWeathering Testing forElectronic ComponentsfnoC29lia
eidtnfnoCSpecimen MountingbaLQWeathering Testing forElectronic Components30lia
Specimen Mountingliaeidtn Many weathering tests are performed on plaques,painted panels, or prepared specimensfnoC However, for methods like IEC 60068-2-5 and MILSTD 810, these tests are usually run on finishedcomponents/productsbaLQ Mounting three-dimensional (3D) specimens cancause issues with thermal and irradiance uniformityWeathering Testing forElectronic Components31
Specimen Mounting Tipsliaeidtn Avoid putting large specimens too close to the lampsfnoC Put the surface of most interest facing the lampsbaLQ Avoid backing flat parts with insulating materials Specimens can be hotter than the black panel!Weathering Testing forElectronic Components32
3D Specimen HoldersbaLQWeathering Testing forElectronic ComponentseidfnoC3D specimen holders can beused to maintain properdistance from lamps33tnlia
Conclusionstnlia Electronic testing often brings some weathering &lightfastness challenges Identify the common use for a component, and decideif solar thermal load or weathering are more important Utilize test tailoring to give you a more realistic resultby customizing these tests Take care to utilize proper specimen mountingtechniques for 3D specimens.eidbaLQWeathering Testing forElectronic ComponentsfnoC34
Questions?eidtnbaLQfnoCinfo@q-lab.comWeathering Testing forElectronic Components35lia
Electronic Components 34 Conclusions Electronic testing often brings some weathering & lightfastness challenges Identify the common use for a component, and decide if solar thermal load or weathering are more important U
